US Patent Issued to NTN on July 21 for "Condition monitoring system and data analyzer" (Japanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,845, issued on July 21, was assigned to NTN Corp. (Osaka, Japan).

"Condition monitoring system and data analyzer" was invented by Hiroyuki Iwanaga (Kuwana, Japan) and Takashi Haseba (Kuwana, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A condition monitoring system includes a data measurement device, a data analyzer, and a diagnosis device. The data measurement device obtains, according to a measurement condition provided, measurement data from a detection signal of a sensor. The data analyzer performs an analysis process on the measurement data obtained by the data measurement device. The diagnosis device performs a diagnosis process of dia...