US Patent Issued to Novatek Microelectronics on May 19 for "Display device for examining the status of a gate line and integrated circuit thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,633,240, issued on May 19, was assigned to Novatek Microelectronics Corp. (Hsinchu, Taiwan).

"Display device for examining the status of a gate line and integrated circuit thereof" was invented by Yao-Chung Chang (Taichung City, Taiwan), Chih-Chang Lai (Taichung City, Taiwan) and Yi-Cheng Yuan (New Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure describes a display device for examining the status of a gate line and an integrated circuit thereof. The integrated circuit includes analog front-end (AFE) circuits and first switches. The AFE circuits examine whether any one inspected gate line among the gate lines of the displ...