ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,160, issued on Sept. 9, was assigned to NORTHROP GRUMMAN SYSTEMS Corp. (Falls Church, Va.).
"Systems and methods for measuring characteristics of cryogenic electronic devices" was invented by Scott F. Allwine (Leesburg, Va.), Sunny Bagga (Corona, Calif.), Brian J. Cadwell (Pasadena, Md.) and Shaun Mark Goodwin (East New Market, Md.).
According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure relates to systems and methods for measuring impedance characteristics of a cryogenic device under test (DUT). A channel select circuit can be configured in a first state to electrically isolate a channel output circuit from the cryogenic DUT and in a second ...