ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,501, issued on Jan. 27, was assigned to NORTHROP GRUMMAN SYSTEMS Corp. (Falls Church, Va.).

"Probe system with integrated choke inductor" was invented by Jesse H. Gonzales (Mclean, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The proposed probe wedge or probe card is configured to be used for a wafer probe system to enhance the test process more efficiently. The probe wedge or probe card includes one or more inductive probing needles and one or more conductive probing needles. Each inductive probing needle includes a shaft and a choke inductor integrated with the shaft. The shaft includes a first end section, a second end section, and an inter...