US Patent Issued to Nordic Semiconductor ASA on June 23 for "Integrated-circuit chip for retention cell testing" (Norwegian Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,469, issued on June 23, was assigned to Nordic Semiconductor ASA (Trondheim, Norway).

"Integrated-circuit chip for retention cell testing" was invented by Ashraf Mohammed (Trondheim, Norway).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated-circuit chip comprises a plurality of scan flip-flops and a retention cell. The chip is configured to have a scan-capture mode, in which the plurality of scan flip-flops and the retention cell are connected to respective functional circuitry of the integrated-circuit chip, and to have a scan-shift mode, in which the plurality of scan flip-flops and the retention cell are connected so as to form a scan c...