ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,499, issued on May 26, was assigned to Nokomis Inc. (Canonsburg, Pa.).
"Testing of microelectronics device and method" was invented by Todd Eric Chornenky (Carmichaels, Pa.), James Robert Uplinger II (Cranberry Township, Pa.), Andrew Richard Portune (Oakdale, Pa.) and Walter J. Keller III (Bridgeville, Pa.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device and method to test microelectronic parts to determine whether the parts are compromised by active illumination in a testing fixture by analysis of emission metrics."
The patent was filed on Jan. 21, 2024, under Application No. 18/418,289.
*For further information, including images, charts an...