US Patent Issued to Nokia Technologies on April 21 for "Reporting integrity measurement error distribution groups" (Illinois Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,610,342, issued on April 21, was assigned to Nokia Technologies Oy (Espoo, Finland).

"Reporting integrity measurement error distribution groups" was invented by Ryan Keating (Naperville, Ill.) and Hyun-Su Cha (Naperville, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Reporting integrity measurement error distribution groups is provided. An apparatus may include at least one processor, and at least one memory storing instructions that, when executed by the at least one processor, cause the apparatus at least to communicate, with a network device, information that may include one or more integrity distribution groups (IDGs) and corresponding distri...