ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,665, issued on April 14, was assigned to NITTO DENKO Corp. (Ibaraki, Japan).

"Multilayer structure, piezoelectric device using the same, manufacturing method of multilayer structure, and manufacturing method of piezoelectric device" was invented by Daisuke Nakamura (Ibaraki, Japan), Taketo Ishikawa (Ibaraki, Japan), Gaku Tsuburaoka (Ibaraki, Japan) and Hironobu Machinaga (Ibaraki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A multilayer structure and a piezoelectric device using the same, which have satisfactory crystal orientation even in the submicron region of the thickness of a piezoelectric layer, are provided. The multilayer structur...