US Patent Issued to Nissan Motor on Sept. 8 for "Quality evaluation method and quality evaluation device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,092, issued on Sept. 8, was assigned to Nissan Motor Co. Ltd. (Kanagawa, Japan).

"Quality evaluation method and quality evaluation device" was invented by Takehito Teraguchi (Kanagawa, Japan), Hiroshi Kasai (Kanagawa, Japan) and Yusuke Takayama (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A quality evaluation device operates to: detect a defect present in a component based on a detection result obtained by a non-destructive inspection method; extract feature amounts of the defect from detection information of the defect; specify an evaluation target site in which the defect is present in the component; acquire one or more usage st...