US Patent Issued to Nissan Motor on Feb. 10 for "Abnormality detection device and abnormality detection method" (Japanese Inventor)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,497, issued on Feb. 10, was assigned to Nissan Motor Co. Ltd. (Kanagawa, Japan).

"Abnormality detection device and abnormality detection method" was invented by Satoshi Ichikawa (Kanagawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection device detects an abnormality of a screen display displayed on a display. The abnormality detection device is configured to monitor screen display data displayed by the display; determine, based on the screen display data and a user operation regarding the screen display performed by a user, whether or not the screen display has transitioned according to the user operation; extract a scr...