US Patent Issued to NIKON on Aug. 25 for "Visual field testing method, visual field testing device, and visual field testing program" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,714,301, issued on Aug. 25, was assigned to NIKON Corp. (Tokyo).

"Visual field testing method, visual field testing device, and visual field testing program" was invented by Chikara Nakamura (Tokyo), Taishi Aoki (Narashino, Japan), Teruo Horikawa (Inagi, Japan) and Hisao Osawa (Kashiwa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A visual field testing method is a visual field testing method of testing a visual field range divided into at least a first partial area and a second partial area, the method including: a step of measuring sensitivities of a plural first test points that are included in the first partial area; and a step of performing...