US Patent Issued to NICHIA on July 14 for "Illumination device and inspection device" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,684,249, issued on July 14, was assigned to NICHIA Corp. (Anan, Japan).

"Illumination device and inspection device" was invented by Yohei Kawano (Tokushima, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An illumination device includes a light source module and a light reflective member. The light source module includes a substrate having a first surface and a plurality of light sources thereon, each light source emitting light including first light and second light having luminance lower than the first light. The light reflective member is disposed on a first surface side of the substrate and has a reflective surface. The reflective surface inclu...