US Patent Issued to NICE on Dec. 16 for "System and method for quality planning data evaluation using target KPIs" (Indian Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,404, issued on Dec. 16, was assigned to NICE LTD. (Ra'anana, Israel).

"System and method for quality planning data evaluation using target KPIs" was invented by Abhijit Mokashi (Pune, India) and Onkar Hingne (Pune, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for monitoring a quality of interactions include: receiving one or more quality metrics relating to one or more quality targets; determining, on a periodic basis, a current quality value for each of the one or more quality targets; calculating a deviation of the current quality value from a desired value of the quality target; weighting the one or more quality target...