US Patent Issued to NETZSCH-Geratebau on May 19 for "Thermal analysis system and thermal analysis method" (Japanese Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,582, issued on May 19, was assigned to NETZSCH-Geratebau GmbH (Selb, Germany).

"Thermal analysis system and thermal analysis method" was invented by Ryoichi Kinoshita (Shizuoka, Japan) and Kenta Sato (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a thermal analysis system and a thermal analysis method capable of easily performing thermal analysis while suppressing atmospheric exposure associated with sample movement. A thermal analysis system according to the present disclosure includes a sample preparing unit and a thermal analyzing unit. The sample preparing unit includes a wall portion forming an internal space, a gate ...