US Patent Issued to NetApp on Dec. 2 for "Combined garbage collection and data integrity checking for a distributed key-value store" (Colorado, California Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,923, issued on Dec. 2, was assigned to NetApp Inc. (San Jose, Calif.).

"Combined garbage collection and data integrity checking for a distributed key-value store" was invented by Wei Sun (Boulder, Colo.), Mark David Olson (Longmont, Calif.) and Anil Paul Thoppil (Pleasanton, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are described for a streamlined garbage collection process during which data integrity checking is also performed for a distributed key-value (KV) store utilized by a distributed storage system. According to one embodiment, by making use of full or truncated block IDs (rather than an intermediate probabilis...