US Patent Issued to NEC on Sept. 8 for "Measurement device, measurement system, measurement method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,727,787, issued on Sept. 8, was assigned to NEC Corp. (Tokyo).

"Measurement device, measurement system, measurement method, and recording medium" was invented by Zhenwei Wang (Tokyo), Chenhui Huang (Tokyo) and Kenichiro Fukushi (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device that includes a calculation unit that calculates, using sensor data measured by a sensor according to a measurement motion regarding a limb of a user, the sensor being attached to the user at a predetermined attachment site, a length and a central angle of an arc related to a trajectory of the sensor in a period of the measurement motion, and an estimation...