ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,573, issued on Nov. 3, was assigned to NEC Corp. (Tokyo).
"Inspection system, extraction device, and inspection method" was invented by Akira Tsuji (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system, an extraction device, an inspection method, an extraction method, and a program that are capable of improving measurement accuracy are provided. An inspection system includes: a measurement device being arranged at a measurement point inside a tunnel, having a reference point, and acquiring a plurality of pieces of data including coordinate values and brightness values of a wall surface of the tunnel as point cloud data by using o...