US Patent Issued to NEC on June 30 for "Region importance estimation" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,671,824, issued on June 30, was assigned to NEC Corp. (Tokyo).

"Region importance estimation" was invented by Hayato Itsumi (Tokyo), Koichi Nihei (Tokyo), Florian Beye (Tokyo), Charvi Vitthal (Tokyo), Takanori Iwai (Tokyo) and Yusuke Shinohara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "To provide a technique which makes it possible to suitably estimate an important region and a non-important region in an image, an information processing apparatus includes: an obtaining means for obtaining input data which includes at least one of image data and point cloud data; an estimating means for estimating levels of importance with respect to a respect...