US Patent Issued to NEC on June 23 for "Image analysis apparatus, image analysis method, and a non-transitory storage medium" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,677, issued on June 23, was assigned to NEC Corp. (Tokyo).

"Image analysis apparatus, image analysis method, and a non-transitory storage medium" was invented by Jianquan Liu (Tokyo), Noboru Yoshida (Tokyo), Tingting Dong (Tokyo), Ryo Kawai (Tokyo), Satoshi Yamazaki (Tokyo), Karen Stephen (Tokyo), Yuta Namiki (Tokyo), Naoki Shindou (Tokyo) and Youhei Sasaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "To utilize a result of image analysis, an image analysis apparatus 100 includes an analysis result acquisition unit 110 and a counting unit 111. The analysis result acquisition unit 110 acquires analysis information being information acquired ...