US Patent Issued to NEC on June 2 for "Learning device, parameter adjustment method and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,646,301, issued on June 2, was assigned to NEC Corp. (Tokyo).

"Learning device, parameter adjustment method and recording medium" was invented by Tomokazu Kaneko (Tokyo), Soma Shiraishi (Tokyo) and Ryosuke Sakai (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A learning device includes a learning model for a still image. The learning model includes a mask generation means configured to generate a first object mask identifying an area in which an object exists in a still image, for each individual object. A first parameter including at least one parameter used for processing of generating the first object mask is adjusted based on a first loss. The ...