ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,009, issued on Feb. 17, was assigned to NEC Corp. (Tokyo).
"Image analysis device and image analysis method" was invented by Taichi Tanaka (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "The image analysis device 100 includes a complex matrix calculation unit 11 which calculates a complex matrix that reflects a phase difference in all pairs of images in multiple images in which a same region is recorded, a parameter candidate selection unit 12 which selects multiple candidates of parameter which explains a phase shift, a candidate evaluation unit 13 which evaluates likelihood of the multiple candidates using the complex matrix and a predetermi...