US Patent Issued to NEC on Feb. 10 for "Constraint condition learning device, constraint condition learning method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,544,918, issued on Feb. 10, was assigned to NEC Corp. (Tokyo).

"Constraint condition learning device, constraint condition learning method, and storage medium" was invented by Hiroyuki Oyama (Tokyo) and Rin Takano (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A constraint condition learning device 1X mainly includes a conversion means 15X and a constraint condition estimation means 16X. The conversion means 15X converts first time series data regarding a state and an input of a robot system during an execution period of a task executed by the robot system into second time series data represented by propositions. The constraint condition estimati...