US Patent Issued to NEC on April 7 for "Similarity calculation system, similarity calculation apparatus, similarity calculation method, and similarity calculation program" (Japanese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,598,057, issued on April 7, was assigned to NEC Corp. (Tokyo).

"Similarity calculation system, similarity calculation apparatus, similarity calculation method, and similarity calculation program" was invented by Sanami Nakagawa (Tokyo), Toshiyuki Isshiki (Tokyo) and Hiroto Tamiya (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A similarity calculation system calculating a distance between a first vector stored in a similarity calculation apparatus and a second vector entered from an input terminal wherein the similarity calculation apparatus transmits to the input terminal a ciphertext of each element of the first vector and a weighted distance ta...