US Patent Issued to NEC on April 21 for "Parameter optimization device, parameter optimization method, and parameter optimization program" (Japanese Inventor)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,613, issued on April 21, was assigned to NEC Corp. (Tokyo).

"Parameter optimization device, parameter optimization method, and parameter optimization program" was invented by Seiya Shibata (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A parameter optimization device 800 optimizes input CNN structure information and outputs optimized CNN structure information, and includes stride and dilation use layer detection means 811 for extracting stride and dilation parameter information for each convolution layer from the input CNN structure information, and stride and dilation use position modification means 812 for changing the stride and dilation ...