ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,383,163, issued on Aug. 12, was assigned to NEC Corp. (Tokyo) and NEC Platforms Ltd. (Kanagawa, Japan).
"Test jig, test device, and test method" was invented by Hideki Sato (Kanagawa, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test jig has a contact surface that is brought into contact with an imaging surface of a skin pattern input device, and a groove portion that is provided on the contact surface and connected to the outer edge of the contact surface."
The patent was filed on March 17, 2021, under Application No. 18/281,815.
*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-...