US Patent Issued to NATIONAL INSTITUTE OF METROLOGY, CHINA on Jan. 20 for "Probe module for testing of electrical resistivity of conductive fiber materials" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,711, issued on Jan. 20, was assigned to NATIONAL INSTITUTE OF METROLOGY, CHINA (Beijing).

"Probe module for testing of electrical resistivity of conductive fiber materials" was invented by Senlin Jin (Beijing), Lingling Ren (Beijing), Junwei Cao (Beijing), Guodong Wu (Beijing) and Jianyun He (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe module for testing the resistivity of a conductive fiber material includes four gland spring holes in the upper end gland are uniformly formed in the bottom surface of the gland main body; one end of a pressure spring is abutted against the top of the gland spring holes, and the other end of the pre...