US Patent Issued to National Institute of Meteorological Sciences on May 19 for "Crop condition monitoring system and crop condition monitoring method using the same" (South Korean Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,584, issued on May 19, was assigned to National Institute of Meteorological Sciences (Seogwipo-si, South Korea).

"Crop condition monitoring system and crop condition monitoring method using the same" was invented by Eun Su Jo (Gangneung-si, South Korea) and Kyu Rang Kim (Icheon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A crop condition monitoring system includes a first capacitive moisture condition sensor detects a first voltage according to a water condition, a second capacitive moisture condition sensor detects a second voltage according to a water condition, a non-contact surface temperature sensor configured to detect a surf...