US Patent Issued to National Atomic Research Institute on May 12 for "Quantum detector with vertically stacked structure" (Taiwanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,628,441, issued on May 12, was assigned to National Atomic Research Institute (Taoyuan, Taiwan).

"Quantum detector with vertically stacked structure" was invented by Po-Wen Chen (New Taipei, Taiwan), Jiun-Shen Chen (Taipei, Taiwan), I-Lin Ho (Kaohsiung, Taiwan) and Chi-Tsu Yuan (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A quantum detector is provided with a vertically stacked structure. The detector comprises a conductive substrate, a plurality of quantum detectors configured on the conductive substrate, and a lower electrode. Each of the quantum detectors comprises an electron transport layer (GaAs), a three-dimensional topological ...