US Patent Issued to NANYA TECHNOLOGY on Nov. 3 for "Testing method and memory module under test" (Taiwanese Inventor)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,855, issued on Nov. 3, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan).

"Testing method and memory module under test" was invented by Bo Jung Peng (New Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing method includes the following steps of: inputting a first signal to a memory chip; putting the memory chip into a self-refresh mode according to the first signal; inputting an active command to test the memory chip so as to generate a first testing result according to the first signal; adjusting a bandwidth of the first signal to generate a second signal so as to input to the memory chip; putting the memory c...