US Patent Issued to NANYA TECHNOLOGY on April 21 for "Asymmetric pads structure and test element group module" (Taiwanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,610,787, issued on April 21, was assigned to NANYA TECHNOLOGY Corp. (New Taipei City, Taiwan).

"Asymmetric pads structure and test element group module" was invented by Chiang-Lin Shih (New Taipei City, Taiwan), Meng-Zhen Li (New Taipei City, Taiwan), Wei-Ming Liao (Taoyuan City, Taiwan), Hsueh Han Lu (New Taipei City, Taiwan) and Wei Zhong Li (Taoyuan City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "This invention provides an asymmetric pads structure using at a scribe line of a wafer, comprising a test element device electrically connected to a first pad and a second pad separately, wherein a first spacing between the second pad and the te...