US Patent Issued to NANOENTEK on Feb. 10 for "Fine particle counting method using multi-channel sample chip and fine particle counting apparatus implementing same" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,698, issued on Feb. 10, was assigned to NANOENTEK INC. (Seoul, South Korea).

"Fine particle counting method using multi-channel sample chip and fine particle counting apparatus implementing same" was invented by Chan Il Chung (Seoul, South Korea), Hyoung Seop Lee (Gyeonggi-do, South Korea) and Sanghwa Ahn (Gyeonggi-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a fine particle counting method using a multi-channel sample chip and a fine particle counting apparatus implementing the method, a plurality of samples is observable in a short period of time and even when warpage occurs during a manufacturing process as a sample chip beco...