US Patent Issued to N6 TEC on May 13 for "Methods and systems for sample analysis" (Canadian, American Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,297,494, issued on May 13, was assigned to N6 TEC INC. (Pleasanton, Calif.).

"Methods and systems for sample analysis" was invented by Pranav Patel (Pleasanton, Calif.), Yassine Kabouzi (Pleasanton, Calif.), Amir Sadri (Markham, Canada) and Yann Jouvenot (Benicia, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides methods and systems comprising use of a device. A device may comprise a plurality of locations configured to contain one or more samples, a plurality of thermal elements corresponding and disposed adjacent to the plurality of locations, wherein the plurality of elements are configured to affect a thermal cond...