US Patent Issued to MONTAGE TECHNOLOGY on May 12 for "Detection structure for chip edge cracks and detection method thereof" (Chinese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,109, issued on May 12, was assigned to MONTAGE TECHNOLOGY Co. LTD. (Shanghai).

"Detection structure for chip edge cracks and detection method thereof" was invented by Xiong Zhang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present application discloses a detection structure for chip edge cracks and a detection method thereof. In one embodiment, the detection structure comprises a test ring located between a chip scribe line and a sealing ring, wherein the chip internally comprises two test pads for detecting continuity of the test ring, the sealing ring comprises a P-type doped ring located in a substrate and a shallow trench isolati...