ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,293, issued on Dec. 16, was assigned to MLOptic Corp. (Redmond, Wash.).
"Multi-configurable wavefront tester" was invented by Pengfei Wu (Bellevue, Wash.), Wei Zhou (Sammamish, Wash.), Wei Wang (Nanjing, China) and Yongshui Cai (Nanjing, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A wavefront tester for measuring the wavefront of a sample via an optical path, the wavefront tester including a mirror, an imaging lens, an aperture, a beam splitter, a wavefront sensor, a lens selection system including a plurality of optical lenses, a suitable optical lens of which is commensurate with the sample and selected to be disposed in the optical path ...