US Patent Issued to MITUTOYO on June 23 for "One-dimensional measuring machine and computer-readable non-transitory medium" (Japanese Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,249, issued on June 23, was assigned to MITUTOYO Corp. (Kawasaki, Japan).

"One-dimensional measuring machine and computer-readable non-transitory medium" was invented by Ryunosuke Yano (Miyazaki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A one dimensional measuring machine includes a scale having graduations, a mover that has a light source configured to emit light to the graduations of the scale and a light receiving element configured to receive the light having passed through the scale from the light source, and can move along the scale, a light amount information detector that detects information regarding a light amount of the light ...