US Patent Issued to MITSUBISHI HEAVY INDUSTRIES on March 31 for "Inspection device and inspection method with infrared light for scratch detection on inspection target" (Japanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,590,903, issued on March 31, was assigned to MITSUBISHI HEAVY INDUSTRIES LTD. (Tokyo).

"Inspection device and inspection method with infrared light for scratch detection on inspection target" was invented by Yuki Yano (Tokyo), Nobuyuki Kamihara (Tokyo), Takayuki Moritake (Tokyo), Kohei Kawazoe (Tokyo), Kiwamu Nakajima (Tokyo), Toshinobu Muraki (Tokyo), Yusuke Hashida (Tokyo) and Kanata Fujii (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection device includes an infrared acquisition unit for acquiring infrared light detected by an infrared camera for detecting infrared light from an inspection target that includes an electroconductive me...