US Patent Issued to Mitsubishi Electric on Oct. 27 for "Semiconductor inspection apparatus and semiconductor manufacturing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,777,884, issued on Oct. 27, was assigned to Mitsubishi Electric Corp. (Tokyo).

"Semiconductor inspection apparatus and semiconductor manufacturing apparatus" was invented by Motoki Iinuma (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor inspection apparatus of this disclosure is a semiconductor inspection apparatus that performs a visual inspection of, as an inspection target, a semiconductor module on a surface of which a plurality of semiconductor devices connected to one another by a wire is mounted. This semiconductor inspection apparatus includes a first light source that is arranged in a first casing, emits light in a specific...