US Patent Issued to MITSUBISHI ELECTRIC on Nov. 3 for "Crack inspection device, crack inspection system, and crack inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,166, issued on Nov. 3, was assigned to MITSUBISHI ELECTRIC Corp. (Tokyo).

"Crack inspection device, crack inspection system, and crack inspection method" was invented by Norihiko Hana (Tokyo), Masaki Umeda (Tokyo) and Go Kajiwara (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A controlling circuitry: generates a shape model of a pipe, set a crack occurrence plane in an inner surface of the pipe and set a measurement plane on the basis of the shape model imparted with a boundary condition including pressure information applied to the inner surface of the pipe, performs control in which a change on the measurement plane when a crack has occurred...