ALEXANDRIA, Va., March 3 -- United States Patent no. 12,567,139, issued on March 3, was assigned to Mitsubishi Electric Corp. (Tokyo).

"Appearance inspection apparatus and appearance inspection method for electronic circuit boards" was invented by Yuichi Ikeda (Tokyo), Yotaro Nakane (Tokyo), Akira Minezawa (Tokyo), Kohei Okahara (Tokyo) and Yukihiro Toku (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An appearance inspection apparatus includes an imaging unit, a reconstructed image generation unit, and an image comparison unit. The imaging unit images an object. The reconstructed image generation unit generates a reconstructed image by using a model, the reconstructed image being an image to be obtain...