ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,704, issued on Dec. 16, was assigned to Mitsubishi Electric Corp. (Tokyo).
"Abnormality symptom analyzing device" was invented by Kotaro Sanai (Tokyo), Emi Yoneda (Tokyo) and Masayo Nakagawa (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality symptom analyzing device comprises: a data request receiver to perform request and reception of data, required for analyzing an abnormality symptom(s), including measurement information obtained from a sensor(s) of a facility, an abnormality symptom(s) detected from the measurement information and inspection information of the facility; a data storage device to store the data acquired by the da...