ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,047, issued on Oct. 27, was assigned to Milwaukee Electric Tool Corp. (Brookfield, Wis.).

"Testing device" was invented by Benjamin Oliver Ryan Cabot (Milwaukee) and Gareth Mueckl (Milwaukee).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing device including a main housing, and a probe housing, wherein the probe housing is rotatably coupled to the main housing. The testing device further includes a first test probe and a second test probe. The first test probe may be configured to be inserted into an alternating-current receptacle. The second test probe is coupled to the probe housing. The second test probe may be configured to be inserted int...