US Patent Issued to Micron Technology on Sept. 9 for "Probabilistic data integrity scans using risk factor estimation" (American, Indian Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,412,616, issued on Sept. 9, was assigned to Micron Technology Inc. (Boise, Idaho).

"Probabilistic data integrity scans using risk factor estimation" was invented by Robert Winston Mason (Boise, Idaho), Phani Raghavendra Yasasvi Gangavarapu (Bengaluru, India), Pitamber Shukla (Boise, Idaho) and Qun Su (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and apparatuses include determining a read counter for a portion of memory of a memory device satisfies a read threshold. A weighted subportion identifier for the portion of memory is selected in response to the read counter satisfying the threshold. The weighted subportion iden...