US Patent Issued to Micron Technology on Sept. 29 for "Tracking latch upset events using a trim register" (Idaho Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,661, issued on Sept. 29, was assigned to Micron Technology Inc. (Boise, Idaho).

"Tracking latch upset events using a trim register" was invented by John M. Gonzales (Boise, Idaho), Christopher G. Wieduwilt (Boise, Idaho), Seth A. Eichmeyer (Boise, Idaho) and Matthew D. Jenkinson (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatuses, systems, and methods for tracking latch upset events using a trim register are described. An example method includes reading trim data from trim registers in a non-volatile memory device. The example method can further include generating parity data for the trim data. The example method can further in...