US Patent Issued to Micron Technology on Sept. 1 for "Read command fault detection in a memory system" (California Inventor)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,675, issued on Sept. 1, was assigned to Micron Technology Inc. (Boise, Idaho).

"Read command fault detection in a memory system" was invented by Melissa I. Uribe (El Dorado Hills, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for read command fault detection in a memory system are described. For example, a memory device may be configured to set a field of a register with a first value, corresponding to a state where a read command has not been decoded. If the memory device receives and decodes a read command from a host device, the memory device may set the field with a second value. The memory device indicate a...