US Patent Issued to Micron Technology on Oct. 27 for "Error detection for programming single level cells" (California Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,393, issued on Oct. 27, was assigned to Micron Technology Inc. (Boise, Idaho).

"Error detection for programming single level cells" was invented by Tomer Tzvi Eliash (Sunnyvale, Calif.) and Yu-Chung Lien (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for error detection for programming single level cells of a memory system are described. The memory system may receive a write command for writing data to a block of memory cells and generate a write voltage to write the data to the block of memory cells. The memory system may compare the write voltage to a reference voltage and determine whether the write...