US Patent Issued to Micron Technology on May 26 for "Two-tier defect scan management" (California, Idaho Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,985, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho).

"Two-tier defect scan management" was invented by Kishore Kumar Muchherla (Fremont, Calif.), Robert Loren O. Ursua (Folsom, Calif.), Sead Zildzic (Rancho Cordova, Calif.), Eric N. Lee (San Jose, Calif.), Jonathan S. Parry (Boise, Idaho), Lakshmi Kalpana K. Vakati (Fremont, Calif.) and Jeffrey S. McNeil (Nampa, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system can include a processing device operatively coupled with the one or more memory devices, to perform operations that include writing data to the one or more memory devices and performing one or more scan ope...