US Patent Issued to Micron Technology on May 26 for "Randomized or program-erase-cycle-dependent program verify scheme" (California Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,639,441, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho).

"Randomized or program-erase-cycle-dependent program verify scheme" was invented by Yu-Chung Lien (San Jose, Calif.), Lakshmi Kalpana K Vakati (Fremont, Calif.), Dheeraj Srinivasan (San Jose, Calif.), Ting Luo (Santa Clara, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, a memory device may receive a single-level cell (SLC) program command. The memory device may determine, based on at least one of a randomized variable associated with the memory or a program-erase cycle count associated with the memory, a p...