US Patent Issued to Micron Technology on May 26 for "Enabling or disabling on-die error-correcting code for a memory built-in self-test" (Idaho Inventor)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,640,222, issued on May 26, was assigned to Micron Technology Inc. (Boise, Idaho).

"Enabling or disabling on-die error-correcting code for a memory built-in self-test" was invented by Scott E. Schaefer (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations described herein relate to enabling or disabling on-die error-correcting code for a memory built-in self-test. A memory device may read one or more bits, associated with a memory built-in self-test, that are stored in a mode register of the memory device. The memory device may identify, based on the one or more bits, whether the memory built-in self-test is to be performed with on-...