US Patent Issued to Micron Technology on March 31 for "Validity mapping techniques" (Chinese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,518, issued on March 31, was assigned to Micron Technology Inc. (Boise, Idaho).

"Validity mapping techniques" was invented by Xing Wang (Shanghai), Zhen Gu (Shanghai), Xu Zhang (Shanghai) and Liping Xu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for validity mapping techniques are described. A memory device may use a change log to update a mapping that indicates whether data stored at respective physical addresses is valid. For example, the memory device may receive a command associated with data having a corresponding set of addresses (whether logical block addresses or physical addresses). The memory dev...