ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,496, issued on March 31, was assigned to Micron Technology Inc. (Boise, Idaho).
"Host system diagnostic testing" was invented by Binbin Huo (Taufkirchen, Germany) and Olivier Duval (Hudson, N.H.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for host system diagnostic testing are described. A diagnostic tool including a diagnostic executable stored to an external memory may evaluate a system including a host subsystem and a memory subsystem. Upon initialization, the diagnostic executable may configure trace points in one or more layers (e.g., associated with an operating system) of the host subsystem based on dependenc...